High Power Femtosecond Pulse Laser Oscil­lator

Universität Wien

Wien | Website



This laser delivers pulses with a duration of 60 fs, at a repetition rate of 11 MHz, and a central wavelength of 800 nm with a 35nm bandwidth. The above 150 nJ pulse energy allows for machining of various material types. The laser is coupled to an optical microscope, that allows the observation of the sample during laser processing. Pulse shaping with a spatial light modulator is also accessible.


Univ.-Prof. Dr. Eleonora Hendrika Gertruda Mezger-Backus

Research Services

High precision nanostructuring and processing of metals and semiconductors, colloidal nanoparticle laser generation, pulse shaping (phase), pump-probe spectroscopy

Methoden & Expertise zur Forschungsinfrastruktur

The interaction between various material types and the laser can be investigated by pulsed laser matter processing. The short pulses allow investigating processes below the electron-phonon coupling time. The laser machining also allows generation of nanoparticles with precise size and distribution. Pump-probe spectroscopy with shaped pulses and impulsive stimulated Raman scattering are also possible. Addition of multiple optical setups can be arranged.
A custom system allows precise, non-destructive, and in situ focus determination.

Univ.-Prof. Dr. Eleonora Hendrika Gertruda Mezger-Backus
Institut für Physikalische Chemie
T: +43-1-4277-524 40
Please contact the responsible person: Univ.-Prof. Dr. Eleonora Hendrika Gertruda Mezger-Backus
A laser safety course is mandatory before employing the device.
Spot size and pulse number dependence of femtosecond laser ablation thresholds of silicon and stainless steel
O Armbruster, A Naghilou, M Kitzler, W Kautek
Applied Surface Science 396, 1736-1740

Merging spot size and pulse number dependence of femtosecond laser ablation thresholds: modeling and demonstration with high impact polystyrene
A Naghilou, O Armbruster, M Kitzler, W Kautek
The Journal of Physical Chemistry C 119 (40), 22992-22998

Femto-and nanosecond pulse laser ablation dependence on irradiation area: the role of defects in metals and semiconductors
A Naghilou, O Armbruster, W Kautek
Applied Surface Science 418, 487-490

A Multivariate Curve Resolution evaluation of an in-situ ATR-FTIR spectroscopy investigation of the electrochemical reduction of graphene oxide
M Pfaffeneder-Kmen, IF Casas, A Naghilou, G Trettenhahn, W Kautek
Electrochimica Acta 255, 160-167

In-situ and non-destructive focus determination device for high-precision laser applications
O Armbruster, A Naghilou, H Pöhl, W Kautek
Journal of Optics 18 (9), 095401