Kurzbeschreibung
The Atomic Force microscopy (AFM) is one of the most important tools for imaging, measuring, and manipulating matter at the Nano scale. The information is gathered by "touching" the surface with a mechanical probe. Piezoelectric elements that facilitate accurate and precise movements of the tip, enabling very precise scanning. Atomic force microscopy will measure a number of different forces depending on the situation and the sample that you want to measure.
Ansprechperson
Dr. Salvatore Bagiante
Research Services
Sample characterisation, introductions
Methoden & Expertise zur Forschungsinfrastruktur
Micro- and nanofabrication processing, development of new processes, characterization, training
Zuordnung zur Forschungsinfrastruktur
Information on terms of use, cooperation and fees is provided upon request. All such information is defined in a scientific collaboration agreement.