Atomic Force Microscope

Institute of Science and Technology Austria (IST Austria)

Klosterneuburg | Website

Großgerät

Kurzbeschreibung

The Atomic Force microscopy (AFM) is one of the most important tools for imaging, measuring, and manipulating matter at the Nano scale. The information is gathered by "touching" the surface with a mechanical probe. Piezoelectric elements that facilitate accurate and precise movements of the tip, enabling very precise scanning. Atomic force microscopy will measure a number of different forces depending on the situation and the sample that you want to measure.

Ansprechperson

Dr. Salvatore Bagiante

Research Services

Sample characterisation, introductions

Methoden & Expertise zur Forschungsinfrastruktur

Micro- and nanofabrication processing, development of new processes, characterization, training

Zuordnung zur Core Facility

Nanofabrication Facility

Information on terms of use, cooperation and fees is provided upon request. All such information is defined in a scientific collaboration agreement.