Atomic Force Microscope

Institute of Science and Technology Austria (ISTA)

Klosterneuburg | Website

Large equipment

Short Description

The Atomic Force microscopy (AFM) is one of the most important tools for imaging, measuring, and manipulating matter at the Nano scale. The information is gathered by "touching" the surface with a mechanical probe. Piezoelectric elements that facilitate accurate and precise movements of the tip, enabling very precise scanning. Atomic force microscopy will measure a number of different forces depending on the situation and the sample that you want to measure.

Contact Person

Dr. Salvatore Bagiante

Research Services

Sample characterisation, introductions

Methods & Expertise for Research Infrastructure

Micro- and nanofabrication processing, development of new processes, characterization, training

Allocation to Core Facility

Nanofabrication Facility

Information on terms of use, cooperation and fees is provided upon request. All such information is defined in a scientific collaboration agreement.