Fieldemission Scanning Electron Microscope

AIT Austrian Institute of Technology GmbH

Braunau am Inn - Ranshofen | Website

Large equipment

Short Description

The field emission scanning electron microscope can be used to analyze the microstructure of light metals down to the nano range. Furthermore, the investigation of the local chemical composition, crystal structure and orientation of base material and intermetallic phases (EDX, EBSD) is possible.

Contact Person

Dr. Johannes Österreicher

Research Services

• Metallographic investigations
• Damage analysis
• Phase identification
• Dispersoid quantification
• Texture analysis by EBSD

Methods & Expertise for Research Infrastructure

Technical Data

Manufacturer: Tescan

Schottky electron emission source - highest resolution

Detectors:
• 4-quadrant solid-state backscatter electron detector
• Everhart-Thornley detector
• InLens secondary electron detector
• EDAX Octane Elect EDX detector (energy dispersive X-ray spectroscopy, 70 mm² SDD)

Hikari Super EBSD camera: electron backscatter diffraction

Dr. Johannes Österreicher
Center for Low-Emission Transport
+43 50550 6937
johannes.oesterreicher@ait.ac.at
The use is to be agreed in each case.