AIT Austrian Institute of Technology GmbH
Braunau am Inn - Ranshofen | Website
Short Description
The field emission scanning electron microscope can be used to analyze the microstructure of light metals down to the nano range. Furthermore, the investigation of the local chemical composition, crystal structure and orientation of base material and intermetallic phases (EDX, EBSD) is possible.
Contact Person
Dr. Johannes Österreicher
Research Services
• Metallographic investigations
• Damage analysis
• Phase identification
• Dispersoid quantification
• Texture analysis by EBSD
Methods & Expertise for Research Infrastructure
Technical Data
Manufacturer: Tescan
Schottky electron emission source - highest resolution
Detectors:
• 4-quadrant solid-state backscatter electron detector
• Everhart-Thornley detector
• InLens secondary electron detector
• Gatan OnPoint Backscatter electron detector for low acceleration voltages
• EDAX Octane Elect EDX detector (energy dispersive X-ray spectroscopy, 70 mm² SDD)
EDAX Velocity Super EBSD camera: electron backscatter diffraction