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Core competence of the Institute of Physics and Materials Science is the research of the micro- and nanostructure of materials and their influence on the physical and mechanical behaviour.
In a specially designed nanostructure research laboratory we are equipped with a number of high-precision instruments:
Scanning Electron Microscopy
Element analysis with EDX
Small angle X-ray scattering and X-ray diffraction
Various in-situ techniques
Helga Lichtenegger, Univ.Prof. Mag. Dr.rer.nat.
Methods & Expertise for Research Infrastructure
A dedicated nanostructure characterization laboratory has been established in 2012 and features a modern field emission environmental scanning electron microscopy (ESEM) and small- and wide-angle X-ray scattering, including grazing-incidence SAXS (GISAXS, RIGAKU S-Max 3000). Characterization facilities are complemented by state-of-the-art sample preparation (high-precision diamond saw, microtomes, grinding and polishing etc.). X-ray scattering methods represent a special focus of the institute and are continuously further developed, including custom-built in situ devices and add-ons to laboratory equipment and to synchrotron experiments.
In the framework of one of these projects (funded by FFG) a unique x-ray color microscope is being built, capable of x-ray imaging and diffraction in combination with spectroscopy by a novel energy dispersive area detector.