The scanning electron microscope offers several analysis and imaging methods, to investigate a huge variety of geological, biological, antropologic, and acheological solid samples. Photons and electrons emitted by the sample surface after excitation through the primary electron beam are collected by different detectors, which provide visual, chemical, and structural information of the investigated sample. The JEOL JSM-6610 LV scanning electron microscope is a general-purpose instrument with a thermal tungsten cathode. Its low-vacuum capability allows high-resolution imaging and chemical analysis of fragile materials, without requiring a conductive coating. A large sample chamber allows the investigation of up to dm-sized irregular shaped objects. The instrument is currently equipped with a BRUKER energy dispersive spectrometer for semi-quantitative chemical spot analyses and element maps, a BRUKER Electron backscatter diffraction (EBSD) detector for lattice information of the investigated crystalline material, as well as a GATAN MonoCL4 and a MiniCL cathodoluminescence (CL) detector for visual and spectral analyses. In order to carry out analysis and for high-resolution imaging, the surfaces of the samples must be coated with a thin, conductive layer (in the case of non-conductive materials) in order to minimize electrostatic charges. Two sputtering/coating units are available: a LEICA EM SCD 500 for platinum sputtering and carbon coating and a HUMMER V for gold sputtering.
Dr. Wencke Wegner
Scientific and commercial use of the device is possible by arrangement, specifying project details, questions and number of samples, etc. Inquiries to: REM@nhm-wien.ac.at
Methods & Expertise for Research Infrastructure
Imaging (SEI) of biological, archaeological and geological samples plus EDS analyzes and element mapping as well as EBSD and CL analyzes on geological samples.