Variable angle of incidence spectroscopic elipsometer VASE (NIR-VIS-UV:190-1650nm; IR:300-7500cm-1)
Univ.-Prof. DI Dr. Kurt Hingerl
Materialanalytic in the framework of scientific cooperation projects with research institutions and industry
Methods & Expertise for Research Infrastructure
Spectroscopic Ellipsometry is used for the determination of thin film and surface optical properties with monolayer sensitivity (surface physics/analytics).