Short Description
commercial, fully-automized magnetometer
max. field 5 Tesla
temperature range 2K-400K
Contact Person
Univ.-Prof. Dr. Andreas Ney
Research Services
magnetization measurements, temperature range 1.8K-400K, maximum magnetic field 5 Tesla
Methods & Expertise for Research Infrastructure
magnetometry with ultimate sensitivity as a function of temperature and magnetic field
the following can be measured: magnetization, dc-susceptibility, Curie temperature and coercive field (if applicable)
experience with and use of this machine for basic research since 2001
In case of interest please contact us; at least the Helium costs will be charged. JKU website https://www.jku.at/en/institute-of-semiconductor-and-solid-state-physics/research-divisions/solid-state-physics-division/
Tutorial: Basic principles, limits of detection, and pitfalls of highly sensitive SQUID magnetometry for nanomagnetism and spintronics
M. Buchner, K. Höfler, B. Henne, V. Ney, and A. Ney
J. Appl. Phys. 124, 161101 (2018)
DOI: 10.1063/1.5045299
Sensitive SQUID magnetometry for studying nanomagnetism
M. Sawicki, W. Stefanowicz and A. Ney
Semicond. Sci. Technol. 26, 064006 (2011)
DOI: 10.1088/0268-1242/26/6/064006
Magnetic properties of semiconductors and substrates beyond diamagnetism studied by superconducting quantum interference device magnetometry
A. Ney
Semicond. Sci. Technol. 26, 064010 (2011)
DOI: 10.1088/0268-1242/26/6/064010
Limitations of measuring small magnetic signals of samples deposited on a diamagnetic substrate
A. Ney, T. Kammermeier, V. Ney, K. Ollefs, and S. Ye
J. Magn. Magn. Mater. 320, 3341 (2008)
DOI: 10.1016/j.jmmm.2008.07.008
M. Buchner, K. Höfler, B. Henne, V. Ney, and A. Ney
J. Appl. Phys. 124, 161101 (2018)
DOI: 10.1063/1.5045299
Sensitive SQUID magnetometry for studying nanomagnetism
M. Sawicki, W. Stefanowicz and A. Ney
Semicond. Sci. Technol. 26, 064006 (2011)
DOI: 10.1088/0268-1242/26/6/064006
Magnetic properties of semiconductors and substrates beyond diamagnetism studied by superconducting quantum interference device magnetometry
A. Ney
Semicond. Sci. Technol. 26, 064010 (2011)
DOI: 10.1088/0268-1242/26/6/064010
Limitations of measuring small magnetic signals of samples deposited on a diamagnetic substrate
A. Ney, T. Kammermeier, V. Ney, K. Ollefs, and S. Ye
J. Magn. Magn. Mater. 320, 3341 (2008)
DOI: 10.1016/j.jmmm.2008.07.008