University of Applied Sciences Upper Austria
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Short Description
A XRD unit measures the diffraction phenomenon of X-rays and is used to determine the atomic and molecular structure of a crystal. The method is that the wavelength of a X-ray beam is in the range of the atomic distance (0.1-0.3nm) and is diffracted by the crystalline atoms into many specific directions according to Bragg´s Law. These reflexions have specific angles and intensities that can be measured with a goniometer.
Contact Person
FH-Prof. Dipl.-Ing. Dr. Gernot Zitzenbacher
Research Services
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Methods & Expertise for Research Infrastructure
material characterization
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