Short Description
Scanning Kelvin Probe (SKP) is a highly sensitive, non-contact scanning probe technique used for the measurement of the local work function (the minimum energy required to remove an electron from the surface of a material to vacuum) of a material. Unlike traditional Kelvin probe measurements, the use of SKP allows for work function changes across a material to be spatially resolved. SKP has found widespread use due to its ability to sensitively measure changes in the sample surface state.
Given equipment is a Biologic SEC-M470
Contact Person
Matthias Nowak
Research Services
Equipment is user operated. No centralized services.
Methods & Expertise for Research Infrastructure
Equipment is user operated. No centralized services.
Allocation to research infrastructure
Access within the framework of cooperation by agreement