Waverprober Cascade SUMMIT 12000B-M

JKU - Johannes Kepler University Linz

Linz | Website

Large equipment

Short Description

With the semi-automatic wafer probing station Summit 12K integrated circuits on semiconductor wafers up to 12” can be characterized. Probes are available from DC to 330 GHz. For circuit measurements additional equipment is available, e.g. for power measurements, spectral measurements, and network analysis.

Contact Person

Univ.-Prof. DI Dr. Andreas Stelzer

Research Services

Electrical characterization of integrated circuits in the frequency range from DC to 330 GHz. Two RF-positioner and RF-sources with single-ended and true-differential signal generation, as well as DC-probes for power supply are available. Feasible measurements reach from power measurements to spectral- and network analysis at linear and non-linear as well as frequency transforming devices.

Methods & Expertise for Research Infrastructure

Topics: Microwave measurements, IC-design, Radar sensors;
mm-wave components and subsystems, mm-wave imaging systems

Allocation to Core Facility

High-frequency (measurement) technique

Univ.-Prof. DI Dr. Andreas Stelzer
Institut für Nachrichtentechnik und Hochfrequenzsysteme, Abteilung für Hochfrequenzsysteme
+43 732 2468 6372
For details please contact the responsible scientist.