Short Description
Materials Research Diffractometer for high-resolution x-ray diffraction analysis
Contact Person
ao.Univ.-Prof. Dr. Julian Stangl
Research Services
Analysis of single crystal samples using high-resolution x-ray diffraction, determination of lattice parameters and strain state.
Methods & Expertise for Research Infrastructure
Topical Focus: X-ray diffraction analysis of semiconductor nanostructures, determination of crystal structure, defects, and strain state.
Allocation to research infrastructure
For details please contact the responsible scientist.