JKU - Johannes Kepler University Linz
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Materials Research Diffractometer for high-resolution x-ray diffraction analysis
ao.Univ.-Prof. Dr. Julian Stangl
Analysis of single crystal samples using high-resolution x-ray diffraction, determination of lattice parameters and strain state.
Methods & Expertise for Research Infrastructure
Topical Focus: X-ray diffraction analysis of semiconductor nanostructures, determination of crystal structure, defects, and strain state.
Allocation to Core Facility
For details please contact the responsible scientist.