Scanning Electron Microscope FEI QUANTA 200 with Oxford EDS detector

University of Mining Leoben

Leoben | Website

Large equipment

Short Description

Scanning Electron Microscope (tungsten cathode) with Back Scattered Electrons-, Secundary Electrons- und EDX-detector for manual and automated analysis

Contact Person

Ao.Univ.Prof. Christian Bernhard

Research Services

SEM/EDS analysis for characterization of non-metallic inclusions (manual and automated) and failure/damage study, further services by request

Methods & Expertise for Research Infrastructure

Inclusion characterization: Analysis of the inclusion landscape in semi-finished material and final products or in samples of secundary metallurgy (modification of the inclusion landscape during process) concerning distribution, number, size, content, morphology and chemical composition; manual measurements or automated feature analysis

Failure and damage analysis: Investigation of fractured surfaces and other cases of damage

Primary Metallurgy: Analysis of ores and pellets

Ao.Univ.Prof. Christian Bernhard
Lehrstuhl für Eisen- und Stahlmetallurgie
Please contact Prof. Christian Bernhard!