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This laser delivers pulses with a duration of 60 fs, at a repetition rate of 11 MHz, and a central wavelength of 800 nm with a 35nm bandwidth. The above 150 nJ pulse energy allows for machining of various material types. The laser is coupled to an optical microscope, that allows the observation of the sample during laser processing. Pulse shaping with a spatial light modulator is also accessible.
Univ.-Prof. Dr. Eleonora Hendrika Gertruda Mezger-Backus
High precision nanostructuring and processing of metals and semiconductors, colloidal nanoparticle laser generation, pulse shaping (phase), pump-probe spectroscopy
Methods & Expertise for Research Infrastructure
The interaction between various material types and the laser can be investigated by pulsed laser matter processing. The short pulses allow investigating processes below the electron-phonon coupling time. The laser machining also allows generation of nanoparticles with precise size and distribution. Pump-probe spectroscopy with shaped pulses and impulsive stimulated Raman scattering are also possible. Addition of multiple optical setups can be arranged.
A custom system allows precise, non-destructive, and in situ focus determination.
A laser safety course is mandatory before employing the device.
O Armbruster, A Naghilou, M Kitzler, W Kautek
Applied Surface Science 396, 1736-1740
Merging spot size and pulse number dependence of femtosecond laser ablation thresholds: modeling and demonstration with high impact polystyrene
A Naghilou, O Armbruster, M Kitzler, W Kautek
The Journal of Physical Chemistry C 119 (40), 22992-22998
Femto-and nanosecond pulse laser ablation dependence on irradiation area: the role of defects in metals and semiconductors
A Naghilou, O Armbruster, W Kautek
Applied Surface Science 418, 487-490
A Multivariate Curve Resolution evaluation of an in-situ ATR-FTIR spectroscopy investigation of the electrochemical reduction of graphene oxide
M Pfaffeneder-Kmen, IF Casas, A Naghilou, G Trettenhahn, W Kautek
Electrochimica Acta 255, 160-167
In-situ and non-destructive focus determination device for high-precision laser applications
O Armbruster, A Naghilou, H Pöhl, W Kautek
Journal of Optics 18 (9), 095401