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Large equipment

Halbautomatischer Waferprober

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Vienna University of Technology

Wien


Short Description

Rauscharmer, geschirmter, halbautomatischer Waferprober, Temperaturbereich -20C bis 200C

Contact Person

Dr. Michael Watltl

Research Services

Zuverlässigkeitsmessungen mikroelektronischer Bauelemente

Methods & Expertise for Research Infrastructure

Langzeitzuverlässigkeitsmessungen

Terms of Use

Nach Vereinbarung

Cooperation Partners

FKE

Contact

Dr. Michael Watltl
Institut für Mikroelektronik
michael.waltl@tuwien.ac.at
https://www.iue.tuwien.ac.at/staff/waltl

Location

Location on map

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