The SAES system at ZONA (Jamp-9500F von JEOL) allows performing surface analytics on solid surfaces with respect to the determination of elemental concentrations and obtaining (limited) chemical information (point measurements as well as surface mappings). The depth of information is in the range between 5-10 nm, depending upon the sample material. The maximum lateral resolution of this system is for electron microscopy 3 nm and 8 nm for Augeranalytics, respectively. Depth profiling by Ar-ion sputtering is possible. A fracture stage is available in the UHV system to prepare surfaces without exposure to air.
Assoz.-Prof. DI Dr. David Stifter
Basic research projects, publicly funded research projects with company participation, pure industry research and pure measurement services
Methods & Expertise for Research Infrastructure
Expertise in the surface analytics of metals and their oxides as well as semiconductors and isolators, nanoparticles and clusters, thin films. Special expertise in the investigation of "uncooperative" surfaces (e.g. complex heterogenous systems like corroded surfaces, samples from industrial production, powders,...). Depth profiling by ion sputtering. Strengthening of the interdisciplinary cooperation with the expert team of the center for surface- and nanoanalytics.