X-ray photoelectronspectroscopy system (XPS):
The XPS system of ZONA (Nexsa G2 from Thermo Fisher) allows performing surface analytics on solid surfaces with respect to the determination of elemental concentrations and chemical composition. The depth of information is in the range between 5-10 nm, depending upon the sample material. The lateral resolution of this system is at least 10 - 50 µm (standard 200 - 400 µm). By angle resolved measurements additional information on the depth distribution of elements and chemical compounds can be obtained. Depth profiling by Ar-ion cluster sputtering is equally possible without destroying the chemistry of organic compounds. A Raman spectroscopy system is included for measurements on the same spot as by XPS. A vacuum transfer holder is available for introduction of the sample to the system witout exposure to air.
Assoz.-Prof. DI Dr. David Stifter
Basic research projects, publicly funded research projects with company participation, pure industry research and pure measurement services
Methods & Expertise for Research Infrastructure
Expertise in the surface analytics of composite and polymer materials, metals and their oxides as well as semiconductors and isolators. Special expertise in the investigation of "uncooperative" surfaces (e.g. complex heterogenous systems like corroded surfaces, samples from industrial production, powders,...). Depth profiling by ion sputtering and angle resolved measurements. Strengthening of the interdisciplinary cooperation with the expert team of the center for surface- and nanoanalytics.