Short Description
Atomic Force Microscope
Contact Person
Univ.-Prof. Dr. Sabine Hild
Research Services
Sample measurements of surfaces using different AFM methodes
Methods & Expertise for Research Infrastructure
Surface Measurements, Research, Sample Preparation
Use only after profound instructions or by the experts at IPS
Lenzing, MPI Düsseldorf, Uni Ulm, Borealis, Sony, Voest, Poloplast, Engel, Stalim, Eternit, Agfa, Wacker, Profactor
H-Hunt (CEST/Voest), IPPCO (CEST/Voest), Micro Mak (Teufelberger), APMT