Easytom 160 nano-focus X-ray computed tomography system

University of Applied Sciences Upper Austria

Wels | Website

Large equipment

Short Description

The EasyTom 160 nano-focus X-ray computed tomography system enables the non-destructive materials characterization of biologic samples, polymers and light metal alloys with resolution below 1 micron.

Contact Person

Johann Kastner

Research Services

Cooperations in the field of non-destructive and high-resolution materials characterization.

Methods & Expertise for Research Infrastructure

High-resolution X-ray computed tomography of different inhomogeneous materials with optional in-situ characterization of damage mechansims during tensile testing.

Individual measurements and R&D cooperation projects