Short Description
The inVia confocal dispersive Raman microscope from Renishaw is a high-power and high-end Raman system that we have configured specifically for art applications. Equipped with an integrated microscope and dark-field objectives as well as 532 and 785 nm excitation lasers and a CCD detector (-70 °C), the inVia enables the precise examination and characterisation of micro and macro samples of artworks and cross-sections.
This system is ideal for analysing the surface texture of metals, metal corrosion products, plastics, pigments and paint layer analysis, analysis of biological samples, etc. With molecule-specific information, the degradation mechanisms in materials can also be investigated and degradation products can be visualised using 2D/3D imaging (3D volume analysis).
Furthermore, the surface topography can be superimposed with the chemical information (by imaging) and visualised via device's internal WIRE software. The LiveTrack technology makes it possible to always measure in focus, even with rough and uneven samples, having always the maximum Raman scattering yield available, which significantly increases the signal sensitivity.
Contact Person
DIin Dr.in Dubravka Jembrih-Simbürger
Research Services
The Institute for Natural Sciences and Technology in the Arts (INTK) and the Core Facility "Centre for Material Sciences in Art and Conservation (ZMKK)" are central facilities of the Academy of Fine Arts Vienna for the natural scientific (material) analysis of works of art. The facilities support members of the Academy of Fine Arts Vienna or other research institutions, museums, libraries, archives, etc. in the realisation of joint projects within the framework of research funding or contract research and also offers services (third-party funding) for external parties.
The focus is on scientific material analyses of artworks and archive materials using FTIR, (FT & dispersive) Raman, XRF, UV-Vis, HSI, RSI, ESEM (EDX), Py-GC/MS, digital X-ray radiography and photo documentation (Vis, UV, IR, IRR), microscopy, chambers for accelerated ageing of samples.
Special services provided by the InVia Raman microscope from Renishaw, specifically applied to the analysis of art objects:
• Comprehensive imaging technologies
The inVia Raman microscope has a complete set of imaging techniques. These enable the aquisition of detailed and information-rich Raman images of both 2D surfaces and 3D volumes and the overlaying of this chemical information with the surface topography.
• Analysis of uneven/curved samples with rough surface and surface texture
• The LiveTrack™ automated focusing technology maintains focus in both white light and Raman modes during analysis.
• Characterisation of pigments and other materials in art
The system is able to characterise pigments, inks, biological samples, corrosion products and other materials from various artworks as well as cross sections in a molecule-specific manner. The system offers a spectral resolution of 0.3 cm-¹ (FWHM), which ensures precise and detailed analysis.
• 4 WiRE™ software from Renishaw and various spectral databases
The WiRE (Windows-based Raman Environment) software controls the spectra acquisition and provides automated data processing and high-end analysis capabilities.
Methods & Expertise for Research Infrastructure
The inVia™ research-grade Raman microscope from Renishaw offers advanced non-destructive and non-invasive Raman analysis with 532 nm (down to 15 or 100 cm-1, depending on the filter used) and 785 nm (down to 50 cm-1) lasers. It features comprehensive imaging technologies for detailed 2D and 3D Raman imaging. The LiveTrack™ focus tracking allows precise analysis of uneven or curved surfaces (autofocus during whole analysis). Ideal for characterizing pigments, inks, metal corrosion products and other materials in artworks, it provides a spectral resolution of 0.3 cm⁻¹ (FWHM). The WiRE™ software enables efficient data acquisition and analysis, including spectrum identification and particle distribution in high-resolution Raman images. The results of chemical imaging can be overlaid and visualised together with surface topography.