Jeol TEM - Transmission electron microscope 200kV

University of Salzburg

Salzburg | Website

Short Description

The transmission electron microscope (TEM) is equipped with a Cold-FEG electron source (energy dispersion of 0.3 eV).
With this TEM it is possible to study inorganic as well as organic samples down to the sub-nanometer regime (resolution limit TEM: 0.08 nm & STEM: 0.15 nm).

The TEM can be operated at accelerating voltages of 60 kV, 80 kV and 200 kV and is therefore also suitable for biological and beam sensitive samples.

The microscope stands out due to the high brightness of the electron source, the large acquisition angle of the windowless EDX detector (just below 1 sr), a backscatter and secondary electron detector (BEI) and the possibility to acquire high resolution images with element contrast with the high angle annular dark field (HAADF) detector.

Contact Person

Prof. Dr. Oliver Diwald

Research Services

High resolution imaging of solids, nano particles and aerogels (TEM & STEM); elemental analysis (EDX), structural analysis (SAED), imaging of surfaces (BEI), elemental contrast imaging (HAADF)

Methods & Expertise for Research Infrastructure

Phase Identification
• Characterization of the crystal orientation in a structure
• High resolution characterization of grain boundaries, morphology and higher dimensional defects
• Investigation of the local heterogeneity and chemical differences in materials

The instrument is being used for high resolution characterization of chemical and physical properties of solids, as well as nano materials. Typical applications are
• Investigation of lattice defects and crack formation in Mg- and AlTi alloys
• Characterization von Aerogels
• Characterization of MgO, TiO2, ZnO nano particles

Allocation to Core Facility

Electron Microscopy