University of Salzburg
Salzburg | Website
Short Description
The precision ion polishing system (PIPS II) is being used in sample preparation for transmission electron microscopy.
The PIPS II from GATAN is able to thin conventional and cross-section samples with Ar-ions with an accelerating voltage ranging from 0.1 kV to 8 kV down to a thickness of 10 nm.
A built-in high resolution digital optical microscope allows a site specific sample preparation. The sample can be cooled with liquid nitrogen to reduce heat induced artefacts in the sample during the ion bombardment. Furthermore, focused ion beam samples (FIB) can be thinned to the desired thickness.
Contact Person
Prof. Dr. Oliver Diwald
Research Services
Preparation of various sample materials for the transmissions electron microscopy
Methods & Expertise for Research Infrastructure
Preparation of various sample materials for the transmissions electron microscopy
• Conventional samples (metals, ceramics, semiconductors, polymers)
• Cross-section samples
• Post thinning of FIB samples
• Removing artefacts such as amorphous regions and oxide layers
Allocation to Core Facility
2015-2018
Hüsing, N.; Diwald, O.; Musso, M.; Bourret, G.; Redhammer, G.; Huber, O.; Saage, H.
Interreg Österreich-Bayern 2014- 2020
http://www.interreg-bayaut.net/projekte/liste-der-vorhaben/projektzusammenfassung-ab29/