Precision Ion Polishing System (PIPS) - GAAN-PIPS II Plus

University of Salzburg

Salzburg | Website

Large equipment

Short Description

The precision ion polishing system (PIPS II) is being used in sample preparation for transmission electron microscopy.
The PIPS II from GATAN is able to thin conventional and cross-section samples with Ar-ions with an accelerating voltage ranging from 0.1 kV to 8 kV down to a thickness of 10 nm.
A built-in high resolution digital optical microscope allows a site specific sample preparation. The sample can be cooled with liquid nitrogen to reduce heat induced artefacts in the sample during the ion bombardment. Furthermore, focused ion beam samples (FIB) can be thinned to the desired thickness.

Contact Person

Prof. Dr. Oliver Diwald

Research Services

Preparation of various sample materials for the transmissions electron microscopy

Methods & Expertise for Research Infrastructure

Preparation of various sample materials for the transmissions electron microscopy
• Conventional samples (metals, ceramics, semiconductors, polymers)
• Cross-section samples
• Post thinning of FIB samples
• Removing artefacts such as amorphous regions and oxide layers

Allocation to Core Facility

Electron Microscopy

Prof. Dr. Oliver Diwald
Fachbereich Chemie und Physik der Materialien
0043 662 8044 6224
oliver.diwald@sbg.ac.at
https://www.uni-salzburg.at/index.php?id=205087&L=1
Please contact us via science.plus@sbg.ac.at, or contact the responsible person for this section, mentioned in the contact field
University of Applied Sciences Landshut
Synthese, Charakterisierung und technologische Fertigungsansätze für den Leichtbau 'n2m' (nano-to-macro)
2015-2018
Hüsing, N.; Diwald, O.; Musso, M.; Bourret, G.; Redhammer, G.; Huber, O.; Saage, H.
Interreg Österreich-Bayern 2014- 2020
http://www.interreg-bayaut.net/projekte/liste-der-vorhaben/projektzusammenfassung-ab29/