JKU - Johannes Kepler University Linz
Linz | Website
Materials Research Diffraktometer for high-resolution x-ray diffraction analysis
ao.Univ.-Prof. Dr. Julian Stangl
Analysis of single crystal samples using high-resolution x-ray diffraction, determination of lattice parameters and strain state.
Methods & Expertise for Research Infrastructure
Topical Focus: X-ray diffraction analysis of semiconductor nanostructures, determination of crystal structure, defects, and strain state.
For details please contact the responsible scientist.