X-Ray Diffractometer

JKU - Johannes Kepler University Linz

Linz | Website

Large equipment

Short Description

Materials Research Diffraktometer for high-resolution x-ray diffraction analysis

Contact Person

ao.Univ.-Prof. Dr. Julian Stangl

Research Services

Analysis of single crystal samples using high-resolution x-ray diffraction, determination of lattice parameters and strain state.

Methods & Expertise for Research Infrastructure

Topical Focus: X-ray diffraction analysis of semiconductor nanostructures, determination of crystal structure, defects, and strain state.

ao.Univ.-Prof. Dr. Julian Stangl
Institut für Halbleiter- und Festkörperphysik, Abteilung für Halbleiterphysik
+43 732 2468 9604
For details please contact the responsible scientist.